New PDF release: ESD Protection Device and Circuit Design for Advanced CMOS
By Oleg Semenov
ESD defense equipment and Circuit layout for complicated CMOS applied sciences is meant for training engineers operating within the parts of circuit layout, VLSI reliability and trying out domain names. because the difficulties linked to ESD disasters and yield losses develop into major within the sleek semiconductor undefined, the call for for graduates with a easy wisdom of ESD can also be expanding. this present day, there's a major call for to teach the circuits layout and reliability groups on ESD matters. This e-book attempts to handle the ESD layout and implementation in a scientific demeanour. A layout process related to machine simulators in addition to circuit simulator is hired to optimize machine and circuit parameters for optimum ESD in addition to circuit functionality. this system, defined in ESD safety gadget and Circuit layout for complex CMOS applied sciences has ended in a number of profitable ESD circuit layout with very good silicon effects and demonstrates its strengths.
Read or Download ESD Protection Device and Circuit Design for Advanced CMOS Technologies PDF
Best optics books
This publication presents the reader with a transparent evaluate of the huge physique of analysis and improvement paintings conducted within the final 5 years on microstructured polymer optical fibres (mPOFs). It discusses new purposes on the way to be unfolded by means of this rising expertise and comprises for the 1st time information about the fabrication technique for those fibres.
Offers readers with the fundamental technology, expertise, and purposes for all sorts of adaptive lensAn adaptive lens is a lens whose form has been replaced to another focal size via an exterior stimulus reminiscent of strain, electrical box, magnetic box, or temperature. advent to Adaptive Lenses is the 1st publication ever to deal with all the primary operation rules, equipment features, and strength functions of assorted kinds of adaptive lenses.
Instruction manual of Optical layout, 3rd variation covers the basic ideas of geometric optics and their program to lens layout in a single quantity. It accommodates vintage elements of lens layout besides vital smooth tools, instruments, and tools, together with modern astronomical telescopes, Gaussian beams, and computing device lens layout.
- Progress in Optics 45
- Conditionals: From Philosophy to Computer Science
- Handbook of Thermoluminescence
- Optical Networks. A Practical Perspective
- Optical Burst Switched Networks
Extra info for ESD Protection Device and Circuit Design for Advanced CMOS Technologies
Thesis, 1999.  J. -B. Huang and G. Wang, “ESD protection design for advanced CMOS,” Proc. of SPIE, vol. 4600, pp. 123–131, 2001.  J. E. Vinson and J. J. Liou, “Electrostatic discharge in semiconductor devices: protection techniques,” Proc. of the IEEE, vol. 88, No. 12, pp. 1878–1900, 2000.  H. A. Gieser, “ESD testing: HBM to very fast TLP”, tutorial presented at the ISREF 2004.  D. W. Greve, “Programming mechanism of polysilicon resistor fuses,” IEEE Trans. , vol. ED-29, No. 4, pp. 719–724, 1982.
Eng, and K. P. MacWilliams, “Quantifying ESD/EOS latent damage and integrated circuit leakage currents,” EOS/ESD Symposium, pp. 304–310, 1995.  R. Renninger, M. Jon, D. Ling, et al. “A field induced charged-device model simulator,” EOS/ESD Symposium, pp. 59–71, 1989.  S. H. Voldman, “The impact of technology scaling on ESD robustness of aluminum and copper interconnects in advanced semiconductor technologies,” IEEE Trans. on Components, Packaging & Manufacturing Technology, Part C (Manufacturing), vol.
Robinson-Hahn, M. Farris, J. Scanlon, D. Lin, J. Veltri, and G. Groeseneken, “Recommendations to furter improvements of HBM ESD component level test specifications,” EOS/ESD Symposium, pp. 40–53, 1996. Chapter 3 ESD DEVICES FOR INPUT/OUTPUT PROTECTION 1. INTRODUCTION As discussed in Chapter 2, ESD is a very high current event. Therefore, ESD protection circuits should be able to handle a large amount of current without being destroyed. A number of semiconductor devices can be used to safely sink (source) this current; hence can be used as ESD protection circuit.
ESD Protection Device and Circuit Design for Advanced CMOS Technologies by Oleg Semenov